@article {2098, title = {Combined shear force and near-field scanning optical microscopy (With commentary)}, journal = {Applied Physics Letters}, volume = {60}, year = {1992}, month = {1002 Mar 9}, abstract = {

A distance regulation method has been developed to enhance the reliability, versatility, and ease of use of near-field scanning optical microscopy (NSOM). The method relies on the detection of shear forces between the end of a near-field probe and the sample of interest. The system can be used solely for distance regulation in NSOM, for simultaneous shear force and near-field imaging, or for shear force microscopy alone. In the latter case, uncoated optical fiber probes are found to yield images with consistently high resolution.

Commentary: To exploit the evanescent field that is the source of high resolution in near-field microscopy, the probe must be exceptionally close to the sample: \ 10 nm away for 30-50 nm resolution. Here we introduced a distance regulation mechanism based on transverse shear forces between the end of a dithered near-field probe and the sample, which permitted even samples of modest topography to be imaged. Simple, reliable, noninvasive, and applicable to a wide range of samples from whole fixed cells to semiconductor devices, shear force microscopy was a key enabling technology for near-field optics, and soon widely implemented.

}, author = {Betzig, E and Finn, P L and Weiner, J S} }