Combined shear force and near-field scanning optical microscopy (With commentary)

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Applied Physics Letters. 1002 Mar 9;60

Combined shear force and near-field scanning optical microscopy (With commentary) Betzig Lab

Betzig E, Finn PL, Weiner JS

Note: Research in this publication was not performed at Janelia.

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Abstract

A distance regulation method has been developed to enhance the reliability, versatility, and ease of use of near-field scanning optical microscopy (NSOM). The method relies on the detection of shear forces between the end of a near-field probe and the sample of interest. The system can be used solely for distance regulation in NSOM, for simultaneous shear force and near-field imaging, or for shear force microscopy alone. In the latter case, uncoated optical fiber probes are found to yield images with consistently high resolution.

Commentary: To exploit the evanescent field that is the source of high resolution in near-field microscopy, the probe must be exceptionally close to the sample: 10 nm away for 30-50 nm resolution. Here we introduced a distance regulation mechanism based on transverse shear forces between the end of a dithered near-field probe and the sample, which permitted even samples of modest topography to be imaged. Simple, reliable, noninvasive, and applicable to a wide range of samples from whole fixed cells to semiconductor devices, shear force microscopy was a key enabling technology for near-field optics, and soon widely implemented.

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Combined shear force and near-field scanning optical microscopy (With commentary)

Note: Research in this publication was not performed at Janelia.

Abstract