Polarization contrast in near-field scanning optical microscopy.

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Applied Optics. 1992 Aug 1;31(22):4563-8. doi: 10.1364/AO.31.004563

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Polarization contrast in near-field scanning optical microscopy. Betzig LabHarris Lab

Betzig E, Trautman JK, Weiner JS, Harris TD, Wolfe R

Note: Research in this publication was not performed at Janelia.

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Abstract

Recent advances in probe design have led to enhanced resolution (currently as significant as 12 nm) in optical microscopes based on near-field imaging. We demonstrate that the polarization of emitted and detected light in such microscopes can be manipulated sensitively to generate contrast. We show that the contrast on certain patterns is consistent with a simple interpretation of the requisite boundary conditions, whereas in other cases a more complicated interaction between the probe and the sample is involved. Finally application of the technique to near-filed magneto-optic imaging is demonstrated.

PMID: 20725460 [PubMed - indexed for MEDLINE]

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Polarization contrast in near-field scanning optical microscopy.

Note: Research in this publication was not performed at Janelia.

Abstract

PMID: 20725460 [PubMed - indexed for MEDLINE]