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Solving the third-shift problem in ic piracy with test-aware logic locking.

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IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 2015 Jun;34(6):961-71. doi: 10.1109/TCAD.2015.2404876
Solving the third-shift problem in ic piracy with test-aware logic locking. FlyEMScientific Computing Software
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