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In situ SIMS analysis and reactions of surfaces prepared by soft landing of mass-selected cations and anions using an ion trap mass spectrometer.

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Journal of the American Society for Mass Spectrometry. 2009 Jun;20(6):949-56. doi: 10.1364/AO.50.001792
In situ SIMS analysis and reactions of surfaces prepared by soft landing of mass-selected cations and anions using an ion trap mass spectrometer.
Nie Z, Li G, Goodwin MP, Gao L, Cyriac J, Cooks RG
Note: Research in this publication was not performed at Janelia.